Speaker: Dr.Chen Ye
Dr. Ye Chen currently serves as a Qiushi Distinguished Professor at the College of Integrated Circuits, Zhejiang University (since 2026). Prior to this, he was the Chief Scientist at Semitronix Corporation (since 2024), focusing on the R&D and industrialization of domestic EDA tools.
In 2021, he transitioned to KLA Corporation as a Principal Research Scientist following its acquisition of Anchor Semiconductor. His career began in the United States in 2008 at Anchor Semiconductor, where he held the position of R&D Director, after earning his Ph.D. from Zhejiang University that same year.
Subject: From EDA to Closed-Loop Intelligence: The ConVision Platform for Data-Driven DFM
Abstract:
As integrated circuit manufacturing advances to the 3 nm node and beyond, the widening gap between design intent and manufacturing outcomes has become the primary bottleneck for yield ramp-up and production stability. While fabs generate petabytes of inspection, metrology, and test data, this information remains trapped in isolated silos—disconnected from EDA tools and design coordinates—and thus inaccessible for systematic yield optimization.
This talk presents ConVision—a data‑driven, closed‑loop platform that bridges this gap. Integrating modules for design‑pattern profiling (CViDPP), defect detection (CViDGC), intelligent sampling (CViDGS), and yield diagnosis (CViHDM), ConVision enables a seamless flow from inspection to root‑cause analysis and design feedback. Its AI‑powered core breaks down data barriers, correlates layout and process information, and supports sub‑nanometer defect mapping.
We conclude with an outlook on the shift from open‑loop to closed‑loop manufacturing—toward real‑time feedback, self‑evolving process control, and the digital‑twin fab.