Speaker: Thomas LANGE

Thomas Lange, senior R&D designer at IROC has deep technical experience in the effects of radiation on advanced technologies. He is involved in the development of SoCFIT, an EDA tool that assesses soft error propagation in complex digital circuits and evaluates the system-level error rates. He also participates in radiation testing of custom products for specific environments. Recently, he worked with the European Space Agency to design and develop a chip in 16 nm FinFET technology. Thomas holds a PhD in Microelectronics from Turin Polytechnic.

 

Subject:  Soft Error analysis and mitigation for high reliability application

Abstract: 
Soft Error analysis and mitigation for high reliability application